Scanning Electron Microscope(30kV)
Order Code: 18193312.4.2
Category: General Lab Equipment III
Scanning Electron Microscope for Materials Analysis, ZEISS EVO ‘or equivalent’ • For advanced metallurgical testing and analysis on materials in order to detect surface and internal flaws, determine microstructural features, evaluat...
SPECIFICATION
Scanning Electron Microscope for Materials Analysis, ZEISS EVO ‘or equivalent’
• For advanced metallurgical testing and analysis on materials in order to detect surface and internal flaws, determine microstructural features, evaluate heat treatments and establish the causes of failure.
• A resolution of 1.9nm @ 30kV SE with HD
• Total Magnification 5X to 1,000,000X with largest chamber size
• Acceleration voltage of 0.2 to 30kV
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