Order Code: 58017
Category: Chemistry Lab
FEATURES New type cube-corner Michelson interferometer features smaller size and more compact structure, providing higher stability and less sensitive to vibrations and thermal variations than conventional Michelson interferometer. Fully seal...
FEATURES
Technical Specifications
(Optional) Accessories
Diffuse/Specular Reflectance Accessory
It is a versatile diffuse reflectance and specular reflectance?accessory. Diffuse reflection mode is used for transparent and powder sample analysis. Specular reflection mode is for measuring smooth reflective surface and coating surface.
High light throughput
Easy operation, no internal adjustment needed
Optical aberration compensation
Small light spot, able to measure micro samples
Variable angle of incidence
Fast change of powder cup
Horizontal ATR /Variable Angle ATR (30º ~ 60º)
Horizontal ATR is suitable for the analysis of rubber, viscous liquid, large surface sample and pliable solids etc. Variable angle ATR is used for measurement of films, painting (coating) layers and gels etc.
Easy installation and operation
High light throughput
Variable depth of IR penetration
IR Microscope
Micro samples analysis, minimum sample size: 100pm (DTGS detector) and 20pm (MCT detector)
Non-destructive sample analysis
Translucent sample analysis
Two measurement methods: transmission and reflection
Easy sample preparation
Single Reflection ATR
It provides high throughput when measuring materials with high absorption, such as polymer, rubber, lacquer, fiber etc.
High throughput
Easy operation and high analytical efficiency
ZnSe, Diamond, AMTIR, Ge and Si crystal plate can be selected according to application.
Accessory for Determination of Hydroxyl in IR Quartz
Fast, convenient and accurate measurement of?Hydroxyl content in IR quartz
Direct measurement to IR quartz tube, no need to cut samples
Accuracy: £ 1x10-6 (£ 1ppm)
Accessory for Oxygen and Carbon in Silicon Crystal Determination
Special silicon plate holder
Automatic, fast and accurate measurement of oxygen and carbon in silicon crystal
Lower detection limit: 1.0x1016 cm-3 ( at room temperature)
Silicon plate thickness: 0.4~4.0 mm
SiO2 Powder Dust Monitoring Accessory
Special SiO2 powder dust monitoring software
Fast and accurate measurement of SiO2 powder dust
Component Testing Accessory
Fast and accurate measurement of the response?of such components as MCT, InSb and PbS etc.
Curve, peak wavelength, stop wavelength and D* etc can be presented.
Optic Fiber testing Accessory
Easy and accurate measurement of the loss rate of IR optic fiber, overcoming the difficulties for fiber testing, since they are very thin, with very small light-passing holes and uneasy to fix.
Jewelry Inspection Accessory
Accurate identification of jeweiries.
Universal Accessories
Fixed liquid cells and demountable liquid cells
Gas cells with different pathlength